vector network analyzer

Frequency range300kHz to 8GHzfrequency resolution1mHzIFBandwidth settings1Hz to 30kHz

power range-60dBm to+10dBmPower accuracy±1.0dBdisplay10.4-inch TFT color LCD (800x600) touch screen

user interfaceUSB2.0, Ethernet, keyboard, mouse, printer, video

measured performance

Measurement parameters:S11,S21,S12,S22

Number of measurement channels:Up to 16 independent logical channels, with one logical channel defined as a certain excitation signal setting, such as frequency range, test points, power, etc. Each logical channel is displayed as an independent channel window on the screen

Data tracking:Up to 16 data traces are displayed on their respective channel windows,，A data trace displays a certain parameter of the tested device, such as S-parameter, time-domain response, and output

Input power response

Storage tracking:Each of the 16 data traces can save the current value to memory for comparison

Data display format:Logarithmic amplitude, linear amplitude, phase,，Extended phase, group delay, standing wave ratio real and imaginary parts, Smith chart, polar coordinates

Data tagging:Each trace has a maximum of 16 markers Reference labels can be applied to incremental labeling operations, and Smith chart supports 5 labeling formats: linear amplitude/phase, logarithmic amplitude/phase, real/imaginary, R+jX, and G+jB. Polar coordinates support three marking formats: linear amplitude/phase, logarithmic amplitude/phase, and real/imaginary parts

Marking function

Tag Search:Search for maximum value, minimum value, peak value, left peak value, right peak value, target value, target left value, target right value, bandwidth parameter

Tag Searchadditional features:Search range setting: Specific value tracking or single operation search function

Set parameters through tagging:Set the start, stop, and center frequencies through labeled excitation values, and set the reference level through labeled response values

Scanning characteristics

Scanning measurement points:Users can set 2 to 10001 by themselves

scan type:When the excitation power is a fixed value: linear scanning,，Logarithmic scan; Segmented scanning when the frequency is a fixed value: linear power scanning

Segmented scanning feature:Frequency scanning within several independent user-defined segments. Frequency range, number of scanning points, source power, and IF bandwidth should be set for each segment

power:Source power -45 to+10dBm with an accuracy of 0.05dB. In frequency scanning mode, the power slope can be set to a maximum of 2dB/GHz to compensate for high-frequency attenuation in the connection line

Scan trigger: Trigger mode: continuous, single, hold trigger source: internal, manual, external

Trace function

Trace display:Data traces,，Memory traces or simultaneous display of data and memory traces

Trace mathematics:Changing data traces through mathematical operations: adding, subtracting, multiplying, and dividing complex values and memory data being measured

Automatic scale:Automatically selecting scales and reference values has the most effective display trace

Electrical delay:In the low loss test setup, move the calibration surface,，Regarding delay compensation. Compensation for electrical delay when measuring the deviation of linear phase of the tested device.

Phase shift:Phase offset specified degree

statistics:Calculate and display the average, standard deviation, and peak to peak deviation of data traces

other characteristics

Familiar with graphical user interface:The graphical user interface based on the Windows operating system ensures quick and easy instrument use for users

Analyzer control:Using a personal computer

Chart printing/storage:Preview, storage, and printing can be done through MS Work,，Windows Image Browser or Analyzer Print Wizard to complete

Programming function:COM/DCOM automatic control

measuring range

Impedance: 50Ω(75Ω)

Test port connector: N-type, female

Number of test ports: two

Frequency range: 300kHz to 3.2GHz

Frequency accuracy of all continuous waveforms: ±5×10

Frequency resolution: 1mHz

Measurement points: 2 to10001

IF bandwidth: 1 Hz to 30 kHz

(in steps of 1/1.5/2/3/5/7)

Dynamic range (IF bandwidth 10Hz): 130 dB , typ.135dB

measurement speed

Measurement time for each point: 125μs

Source to receive port conversion time: 10ms

Typical scanning time for relative measurement points

Measurement points: 51 201 401 1601

Start at 300kHz, stop at 10MHz, IF bandwidth 30kHz

Not calibrated: 13ms 52ms 104ms 413ms

Calibration of all two ports: 46ms 123ms 226ms 844ms

Start at 10MHz, stop at 3.2GHz, IF bandwidth 30kHz

Not calibrated: 7ms 27ms 53ms 207ms

Calibration of all two ports: 34ms 73ms 125ms 434ms

measurement accuracy

Transmission measurement accuracy (amplitude/phase)

+15 dB to +5dB: 0.2dB/2°

+5 dB to -50dB: 0.1dB/1°

-50 dB to -70dB: 0.2dB/2°

+70 dB to -90dB: 1.0dB/6°

Reverse measurement accuracy (amplitude/phase)

0dB to -15dB: 0.4dB/4°

-15 dB to -25dB: 0.1dB/1°

-25 dB to -35dB: 4.0dB/22°

Trace stability

Trace noise amplitude (IF bandwidth 3kHz): 1mdB rms

Temperature dependence (temperature change per degree): 0.02dB

General characteristics

Working temperature range:+ 5℃ to +40℃

Storage temperature range:- 45℃ to +55℃

Humidity: 90% at 25℃

Atmospheric pressure: 84 to 106.7kPa

Power Supply: 100 to 240 VAC / 47 to 63Hz

Power consumption: 30W

authentication: CE

Size: 426×22×270mm

Weight: 10.6kg

Test port output

match

(Without systematic error correction): 15 dB

Power range:- 45dBm to +10dBm

Power accuracy: ±1.0dB

Power resolution: 0.05 dB

Harmonic distortion:- 30dBc

Test port input

match

(Without systematic error correction): 25 dB

Maximum safe input level:+ 26dBm

Maximum safe input DC voltage: 35V

Noise level:- 120dBm

(Defined as the effective value of the specified background noise. IF bandwidth 10Hz)

Improved accuracy

calibration:The calibration of test settings (including instruments, connecting wires, converters) significantly increases the accuracy of measurements. Calibration allows for the correction of errors caused by incomplete measurement systems, including system orientation, output source and load matching, tracking, and isolation

Calibration:Multiple mixed calibration methods can be used to improve the accuracy level. The most accurate ones are all one port calibration and all two port calibration

Standardization of Reflection and Transmission:Amplitude and phase correction of frequency response errors in reflection and transmission measurements

Full port calibration:Amplitude and phase correction of frequency response,，Correction of directional and output source matching errors for one port reflection measurement

Single channel two port calibration:Perform reflection and single channel transmission measurements, similar to one port reflection measurement,，Amplitude and phase correction of frequency response, correction of output source matching error for reflection measurement

Calibration of all two ports:Measure all S-parameter matrices of the device under test, calibrate the amplitude and phase of the frequency response for reflection and transmission, and match and isolate the output source and load. Isolation calibration can be omitted

Directional calibration(optional):Directional correction attached to reflection correction

Isolation calibration(optional):Isolation correction is attached to transmission correction. Single channel two port calibration in full two port calibration

Error correction interpolation:When the user changes settings such as start/stop frequency and scanning point count,，Compared with the settings during calibration, interpolation or calibration estimation is implemented

Port impedance conversion:The S parameter measured at the 50 Ω port can be converted into the value measured at any impedance test port.

de-embedding:This function allows the role of the fixture circuit connecting the calibration surface and the tested device to be mathematically removed from the measurement results. This circuit is described using the S-parameter matrix in the standard file

implant:This function allows for the virtual integration of the calibration surface and the fixture circuit of the tested device,，Arithmetically simulate the parameters of the tested device. This circuit is described using the S-parameter matrix in the standard file.

SParameter conversion:This function allows the measured S parameters to be converted into the following parameters: reflection impedance, admittance, transmission impedance, and admittance, Reversal of S parameter

Time domain transformation：Use Chip Z conversion to convert measurement data from frequency domain to time domain. Conversion types: bandpass, low-pass impulse, low-pass step, window conversion: minimum, normal, maximum

gate：Selection filter type: bandpass and notch Selection window: widescreen, normal, minimum